COSEDA @ NIWeek 2017
COSEDA Technologies will join NI at NIWeek 2017, the ultimate learning environment that gives you the tools and knowledge to increase your proficiency and develop applications faster, smarter, and more cost-efficiently.
NIWeek 2017 will take place at the Austin Convention Center in Texas from May 22 to 25, 2017.
Semiconductor Test Summit:
Improving the Semiconductor Design To Test Flow (Tue, May 23rd, 9:30 AM - 11:30 AM)
Semiconductor companies face many challenges from the continuous need to drive technology to the unrelenting time to market and quality pressures. By delivering solutions from design to characterization and production test, National Instruments has a unique opportunity to see many of these challenges across the whole flow. To help our customers accelerate time to market, improve quality and manage cost, National Instruments is partnering with technology leaders in the semiconductor design tool world to improve the overall flow from product concept to production. In this session you will hear from two of our partners, COSEDA Technologies and Cadence Design Systems about how we can improve the overall flow from product specification to physical test.
Attendees will learn what other companies are doing to improve the flow from chip design and verification to lab characterization and all the way to production test.
Automated device characterization/validation, Automated Test Systems, PXI Chassis and Controllers, Semiconductor test, Panel Discussion